Dr. Eran Gur אודות המכללה

Dr. Eran Gur

Senior Lecturer

Department of Electronic Engineering
Azrieli – College of Engineering Jerusalem
POB 3566, Jerusalem 9103501, Israel
Tel: 972-2-6588000 Ex. 5515
Mail: erangu@jce.ac.il
Web: www.jce.ac.il


Academic Staff
dean of students


Research Interests:

  • Super-resolution.
  • Imaging systems.
  • Fuzzy logic.
  • Image processing.


Selected publications:

  1. Cojoc , S. Finaurini , P. Livshits , E. Gur , A. Shapira C, V. Mico and Z. Zalevsky, "Toward fast malaria detection by secondary speckle sensing microscopy", Biomedical Optics Express Vol. 3, Issue 5, pp. 991–1005, 2012.
  2. Zalevsky, E. Gur, J. Garcia, V. Micó, and B. Javidi, "Superresolved and field-of-view extended digital holography with particle encoding", Optics Letters Vol. 37, Issue 13, pp. 2766–2768, 2012 – Also chosen by editors to be published in the Virtual Journal of Biomedical Optics, Vol. 7, Issue 9, 2012.
  3. AvivC, E. Gur, C.and Z. ZalevskyPI, "Experimental Results of Revised Missel Algorithm for Imaging through Weakly Scattering Biological Tissue", Applied Optics Vol. 52, Issue 11, pp. 2300–2305, 2013 – Also chosen by editors to be published in the Virtual Journal of Biomedical Optics, Vol. 8, Issue 5, 2013.
  4. Shemer, A. Schwarz, E. Gur, E. Cohen, and Z Zalevsky, Image nonlinearity and non-uniformity corrections using Papoulis – Gerchberg algorithm in gamma imaging systems. Journal of Physics (Conference Series), vol. 605, Issue 1, paper 012010, pp. 1-6, 2015.


  • "New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies)", Zeev Zalevsky, Pavel Livshits and Eran Gur. William Andrew, 2013.

      Recent Papers in Proceedings of Conferences 

  • Zalevsky Z., Meiri A., Gur E., Micó V., Garcia J., and Javidi B., "Resolution Enhancement and Orders Separation in On-axis Nanoparticles based Digital Holography", OSA Technical Digest, Digital Holography and Three-Dimensional Imaging (DH) 2013 paper: DTh1A.1.
  • Gur E., "On the Necessity of Midterm Exams in Electrical Engineering Courses,"              Proceedings of The 43rd Annual Conference of the European Society for Engineering Education- SEFI2015, chapter 2, pp. 1-8, paper 51010, Orléans, France, 2015.

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